Application of bias correction methods to improve U3Si2 sample preparation for quantitative analysis by WDXRF. Brazilian Journal of Radiation Sciences, Rio de Janeiro, Brazil, v. 7, n. 2A (Suppl.), 2019. DOI: 10.15392/bjrs.v7i2A.582. Disponível em: https://www.bjrs.org.br/revista/index.php/REVISTA/article/view/582.. Acesso em: 19 may. 2024.