Intrinsic challenges in x-ray spectrometry instrumentation with CdTe diode detector. Brazilian Journal of Radiation Sciences, Rio de Janeiro, Brazil, v. 9, n. 2C (Suppl.), 2021. DOI: 10.15392/bjrs.v9i2C.1665. Disponível em: https://www.bjrs.org.br/revista/index.php/REVISTA/article/view/1665.. Acesso em: 18 may. 2024.